Optical Microscopy for High-Resolution IPMC Displacement Measurement
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Date
2026
Authors
Dimitrios Minas
Kyriakos Tsiakmakis
Argyrios T. Hatzopoulos
Konstantinos A. Tsintotas
Vasileios Vassios
Maria S. Papadopoulou
Journal Title
Journal ISSN
Volume Title
Publisher
MDPI AG
Abstract
https://orcid.org/0000-0002-9651-2144