Optical Microscopy for High-Resolution IPMC Displacement Measurement
| dc.contributor.author | Dimitrios Minas | |
| dc.contributor.author | Kyriakos Tsiakmakis | |
| dc.contributor.author | Argyrios T. Hatzopoulos | |
| dc.contributor.author | Konstantinos A. Tsintotas | |
| dc.contributor.author | Vasileios Vassios | |
| dc.contributor.author | Maria S. Papadopoulou | |
| dc.date.accessioned | 2026-01-16T20:03:11Z | |
| dc.date.available | 2026-01-16T20:03:11Z | |
| dc.date.issued | 2026 | |
| dc.description.abstract | https://orcid.org/0000-0002-9651-2144 | en |
| dc.identifier.uri | https://dspace.iee.ihu.gr/handle/123456789/12888 | |
| dc.publisher | MDPI AG | en |
| dc.title | Optical Microscopy for High-Resolution IPMC Displacement Measurement | en |
| dc.title.alternative | Sensors | en |
| dc.type | journal-article | en |
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