A New Transition Count Method for Testing of Logic Circuits

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dc.contributor.authorK.I. Diamantaras
dc.contributor.authorN.K. Jha
dc.date.accessioned2024-06-17T17:46:50Z
dc.date.available2024-06-17T17:46:50Z
dc.date.issued1991
dc.description.abstracthttp://www.scopus.com/inward/record.url?eid=2-s2.0-0026130970&partnerID=MN8TOARSen
dc.identifier.urihttps://dspace.iee.ihu.gr/handle/123456789/9991
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.titleA New Transition Count Method for Testing of Logic Circuitsen
dc.title.alternativeIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsen
dc.typejournal-articleen
relation.isAuthorOfPublication

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