Optical Microscopy for High-Resolution IPMC Displacement Measurement

Dimitrios MinasKyriakos TsiakmakisArgyrios T. HatzopoulosKonstantinos A. TsintotasVasileios VassiosMaria S. Papadopoulou2026-01-092026-01-092026https://dspace.iee.ihu.gr/handle/123456789/12884https://orcid.org/0000-0002-9651-2144Optical Microscopy for High-Resolution IPMC Displacement MeasurementSensorsjournal-article